In a new paper published last week[pods name=”publication” slug=”daurer2021″ template=”cite”], we show how ptychography can be used to characterize the extremely short and powerful X-ray pulses generated at the Linac Coherent Light Source (LCLS, SLAC Stanford, USA), one of the few X-ray free-electron lasers operating in the world. The work is the result of a… Continue reading Ptychography for XFEL pulse characterization
Scattering-Based X-ray Imaging and Tomography – Thibault group at University of Trieste