Ptychography for XFEL pulse characterization

An X-ray pulse
The complex-valued wavefront of a pulse generated at LCLS (Stanford)

In a new paper published last week1Daurer2021, we show how ptychography can be used to characterize the extremely short and powerful X-ray pulses generated at the Linac Coherent Light Source (LCLS, SLAC Stanford, USA), one of the few X-ray free-electron lasers operating in the world. The work is the result of a broad collaboration, including present and former members of the Maia group (Uppsala University, Sweden) and the Loh group (National University of Singapore).

This paper follows a previous work2Sala2020 that was conducted with many of the same collaborators to characterize the X-ray pulses generated at FERMI, Italy’s very own free-electron lasers, also hosted here in Trieste.


1 Daurer, B. J.; Sala, S.; Hantke, M. F.; Reddy, H. K. N.; Bielecki, J.; Shen, Z.; Nettelblad, C.; Svenda, M.; Ekeberg, T.; Carini, G. A.; Hart, P.; Osipov, T.; Aquila, A.; Loh, N. D.; Maia, F. R. N. C. & Thibault, P., Ptychographic wavefront characterization for single-particle imaging at x-ray lasers, Optica (2021)
2 Sala, S and Daurer, B J and Odstrcil, M and Capotondi, F and Pedersoli, E and Hantke, M F and Manfredda, M and Loh, N D and Thibault, P and Maia, F R N C, Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography, J. Appl. Crystallogr. (2020)
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