Our research is focused on pushing the limits of X-ray imaging techniques towards ever higher resolution and higher contrast sensitivity. In particular, we look at means of using coherence and the related interference and diffraction phenomena as tools to efficiently encode nanometer-scale information from samples of interest. Decoding this information requires sophisticated algorithmic techniques, which are a specialty of our group.
The two main techniques applied and investigated in our group are called ptychography and speckle-based X-ray imaging.
We are always ready to take on new challenges, with new collaborators and ideas of systems and samples to image. We are also looking for industrial partners.
Daurer, B. J.; Sala, S.; Hantke, M. F.; Reddy, H. K. N.; Bielecki, J.; Shen, Z.; Nettelblad, C.; Svenda, M.; Ekeberg, T.; Carini, G. A.; Hart, P.; Osipov, T.; Aquila, A.; Loh, N. D.; Maia, F. R. N. C. & Thibault, P., Ptychographic wavefront characterization for single-particle imaging at x-ray lasers, Optica (2021),
The S-BaXIT project is carried out by Prof. Thibault’s group, OptImaTo, devoted to the development and application of novel X-ray imaging methods. Have a look at our profiles!