New publication about speckle-based imaging for directional dark-field

Composite image showing the diverse directional dark-field information extracted from the examined sample, a series of hollow carbon fibre composite tubes. The main scattering direction, which is orthogonal to the fibers and thus the axes of the cylinders, is shown by the hue, while the overall scattering strength is encoded by the “value” of the colors (i.e., weak or no scatter appears as black), and the degree of the signal’s directionality is given by the colors’ saturation. Image from the paper, CC BY 4.0.

Faster, improved version of UMPA now available on GitHub!

Photo and UMPA-processed image signals of a speckle-based dataset of a small flower, measured with the new sample-stepping technique at P05, PETRA III, DESY. The sample is much larger than the detector field of view (shown as the red rectangle).

Physics Today article on ptychography

Diffraction patterns from a ptychography experiment.

In this month’s issue of Physics Today, an article written by Prof. Thibault and long-time collaborator Manuel Guizar-Sicairos (Paul Scherrer Institut, Swizerland) presents a review of ptychography. In only 15 years, this imaging technique has become the method offering the highest resolution in 2d and 3d for both X-ray and electron microscopy. The development of… Continue reading Physics Today article on ptychography

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Ptychography for XFEL pulse characterization

The complex-valued wavefront of a pulse generated at LCLS (Stanford)

In a new paper published last week[pods name=”publication” slug=”daurer2021″ template=”cite”], we show how ptychography can be used to characterize the extremely short and powerful X-ray pulses generated at the Linac Coherent Light Source (LCLS, SLAC Stanford, USA), one of the few X-ray free-electron lasers operating in the world. The work is the result of a… Continue reading Ptychography for XFEL pulse characterization