UMPA (short for “Unified Modulated Pattern Analysis”) is a technique for extracting sample information from X-ray images acquired with e.g., speckle-based or grating-based techniques.
Our work on a faster, improved version of UMPA (see also our previous post about the preprint) has recently been published in Optics Express[pods name=”publication” slug=”demarco2023″ template=”cite”]! The paper is available here (open access), and the software itself can be found on GitHub and Zenodo. Find out more about our research here.