In this month’s issue of Physics Today, an article written by Prof. Thibault and long-time collaborator Manuel Guizar-Sicairos (Paul Scherrer Institut, Swizerland) presents a review of ptychography. In only 15 years, this imaging technique has become the method offering the highest resolution in 2d and 3d for both X-ray and electron microscopy. The development of… Continue reading Physics Today article on ptychography
Scattering-Based X-ray Imaging and Tomography – Thibault group at University of Trieste